Device performance over voltage and temperature is gathered on the test equipment and loaded
into the TestEdge database. This information is analyzed and a detailed characterization
report is generated. This report will show how the device performs over temperature, voltage,
and process corners. This information will be used to determine the production test limits
and is often used in device specifications.
Characterization is used to insure there are no design/process sensitivities that will
show up as yield issues during production.
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